Noriyuki Kodera

Title: Noriyuki Kodera: Innovator in Atomic Force Microscopy

Introduction

Noriyuki Kodera is a prominent inventor based in Ishikawa, Japan. He has made significant contributions to the field of atomic force microscopy, holding a total of 2 patents. His work focuses on enhancing the speed and sensitivity of detection in various microscopy applications.

Latest Patents

Kodera's latest patents include an advanced atomic force microscope (AFM) designed to improve the detection of resonant frequency shifts in cantilevers. This innovative AFM extracts reference and phase shift signals from a detection signal provided by a displacement sensor. The reference signal is restrained from phase changes in accordance with the resonant frequency shift, while the phase shift signal reflects the resonant frequency shift. The AFM determines the phase difference between these signals, allowing for precise detection of resonant frequency shifts. Additionally, he has developed a scan-type probe microscope and cantilever drive device that utilizes a driving laser unit to control the cantilever's thermal expansion deformation. This device enhances scanning speed by adjusting the intensity of the laser beam based on the cantilever's displacement.

Career Highlights

Kodera is affiliated with Kanazawa University, where he continues to push the boundaries of microscopy technology. His work has garnered attention for its practical applications in various scientific fields.

Collaborations

He has collaborated with notable colleagues, including Toshio Ando and Takayuki Uchihashi, contributing to advancements in their shared field of research.

Conclusion

Noriyuki Kodera's innovative work in atomic force microscopy exemplifies the impact of dedicated research and development in scientific instrumentation. His contributions continue to influence the field and inspire future advancements.