Hiroshima, Japan

Norimichi Ota

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Mitutoyo Corporation. Active years: 2013.


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Norimichi Ota - Innovator in Surface Texture Measurement

Introduction

Norimichi Ota is a notable inventor based in Hiroshima, Japan. He has made significant contributions to the field of surface texture measurement. His innovative work has led to the development of a specialized device that enhances the accuracy of surface texture analysis.

Latest Patents

Ota holds a patent for a surface texture measuring device. This device includes a rotation driving mechanism that allows for the rotation of the measured substance. It features a roughness detector with a stylus that displaces at the tip of the detector's main body. Additionally, it incorporates at least one skid near the stylus, which outputs the displacement of the stylus as an electric signal. The device also includes a detector driving mechanism that drives a holder, ensuring precise measurements.

Career Highlights

Norimichi Ota is associated with Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has been instrumental in advancing measurement techniques and technologies. Ota's dedication to innovation has positioned him as a key figure in the industry.

Collaborations

Ota has collaborated with notable colleagues, including Keiji Yamada and Hideki Shindo. Their teamwork has contributed to the development of advanced measurement solutions.

Conclusion

Norimichi Ota's contributions to surface texture measurement exemplify his innovative spirit and dedication to precision. His patent for the surface texture measuring device showcases his ability to address complex measurement challenges. Ota's work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
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