Tokyo, Japan

Norihito Fujiwara

This inventor holds 2 USPTO granted patents. Top assignee: Jasco Corporation. Active years: 2021-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Norihito Fujiwara. Retrieved from https://idiyas.com/inventor/norihito-fujiwara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021-2023

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2 patents (USPTO):Explore Patents

Title: Norihito Fujiwara: Innovator in Microspectroscopy

Introduction

Norihito Fujiwara is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of microspectroscopy, particularly in enhancing the accuracy of automatic sample detection techniques. With a total of 2 patents to his name, Fujiwara continues to push the boundaries of innovation in his field.

Latest Patents

Fujiwara's latest patents include the "Microspectroscope having position correction function" and the "Microspectroscope having automatic sample detection function." Both inventions focus on improving the accuracy of automatic sample detection in spectrometry. The microspectroscopes are designed to emit excitation light to a sample, condense reflected or transmitted light, and analyze signals from the spectrometer. These advancements utilize observation images of the sample to perform precise spectrometry.

Career Highlights

Fujiwara is currently employed at Jasco Corporation, where he applies his expertise in microspectroscopy. His work has been instrumental in developing innovative solutions that enhance the functionality and accuracy of spectroscopic instruments.

Collaborations

Some of his notable coworkers include Kento Aizawa and Yoshiko Kubo, who have collaborated with him on various projects within the company.

Conclusion

Norihito Fujiwara's contributions to microspectroscopy exemplify his commitment to innovation and excellence in the field. His patents reflect a deep understanding of the complexities involved in spectrometry, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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