The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Feb. 06, 2020
Applicant:

Jasco Corporation, Tokyo, JP;

Inventors:

Kento Aizawa, Tokyo, JP;

Yoshiko Kubo, Tokyo, JP;

Norihito Fujiwara, Tokyo, JP;

Katsunori Morii, Tokyo, JP;

Assignee:

JASCO Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/44 (2006.01); G01J 3/28 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01J 3/44 (2013.01); G01J 3/0256 (2013.01); G01J 3/2823 (2013.01); G01N 21/65 (2013.01);
Abstract

The present invention relates to improvement in accuracy of an automatic sample detection technique in spectrometry of a microspectroscope. A microspectroscopecomprises: a light sourcethat emits an excitation light to a sample; a condensing lensthat emits the excitation light to a predetermined position of the sampleand condenses a reflected light or a transmitted light from the sample; a spectrometerthat detects a condensed light; and an analysis control unitfor analyzing a signal from the spectrometer; the microspectroscopethat uses an observation image of the sampleto perform spectrometry, wherein


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