This inventor holds 1 USPTO granted patent. Top assignee: Iowa State University Research Foundation Inc.. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Nordica A Hudelson: Innovator in Non-Destructive Inspection Systems
Introduction
Nordica A Hudelson is a notable inventor based in Ames, Iowa. He has made significant contributions to the field of non-destructive inspection systems. His innovative approach has led to the development of a unique system that enhances the accuracy and efficiency of structural inspections.
Latest Patents
Hudelson holds a patent for a non-destructive inspection system that utilizes a template to provide an image-based display of inspection results. This system employs a grid-like template that defines specific locations on a structure for data collection. A portable display device, such as a laptop, receives and displays inspection data in a format that corresponds to the template. This method incorporates "tap test" techniques to measure structural stiffness, offering a visual representation of multiple stiffness measures derived from impact duration.
Career Highlights
Hudelson is affiliated with the Iowa State University Research Foundation Inc., where he continues to advance his research and innovations. His work has garnered attention for its practical applications in various industries, particularly in ensuring the integrity of structures through non-destructive methods.
Collaborations
Hudelson has collaborated with esteemed colleagues, including David K Hsu and John J Peters. Their combined expertise has contributed to the development and refinement of inspection technologies.
Conclusion
Nordica A Hudelson's contributions to non-destructive inspection systems exemplify the impact of innovative thinking in engineering and technology. His patent reflects a commitment to enhancing safety and efficiency in structural assessments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile