The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2001
Filed:
Mar. 03, 2000
David K. Hsu, Ames, IA (US);
Daniel J. Barnard, Ames, IA (US);
John J. Peters, Ames, IA (US);
Nordica A. Hudelson, Ames, IA (US);
Iowa State University, Ames, IA (US);
Abstract
A non-destructive inspection system makes use of a template that is put on a structure to be inspected to provide an image-based display of inspection results. The template, an example of which is a grid, defines locations on the structure from which inspection data are obtained. A portable display device, an example of which is a laptop computer, with information about the template receives information pertaining to inspection data obtained from locations defined by the template and displays inspection results in an image-based format that corresponds to the template. An example of such a system uses “tap test” non-destructive inspection techniques and provides an image-based display of a plurality of structural stiffness measures, each stiffness measure calculated from a measure of impact duration for a “tap”.