This inventor holds 1 USPTO granted patent. Top assignee: Iowa State University Research Foundation Inc.. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Innovations of Daniel J Barnard
Introduction
Daniel J Barnard is an accomplished inventor based in Ames, Iowa. He has made significant contributions to the field of non-destructive inspection systems. His innovative approach has led to the development of a unique system that enhances the accuracy and efficiency of structural inspections.
Latest Patents
Daniel J Barnard holds a patent for a non-destructive inspection system that utilizes a template to provide an image-based display of inspection results. This system employs a grid-like template placed on the structure being inspected, which defines specific locations for data collection. A portable display device, such as a laptop computer, receives and displays inspection data in a format that corresponds to the template. This method incorporates "tap test" techniques to measure structural stiffness, offering a visual representation of multiple stiffness measures derived from impact duration.
Career Highlights
Daniel is affiliated with the Iowa State University Research Foundation Inc., where he continues to advance his research and innovations. His work has garnered attention for its practical applications in ensuring the safety and integrity of various structures.
Collaborations
Throughout his career, Daniel has collaborated with notable colleagues, including John J Peters and Nordica A Hudelson. These partnerships have contributed to the development and refinement of his innovative inspection systems.
Conclusion
Daniel J Barnard's contributions to non-destructive inspection technology exemplify the impact of innovation in engineering. His patented system not only enhances inspection accuracy but also represents a significant advancement in structural safety measures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile