Kanagawa, Japan

Nobuyuki Nakazawa

This inventor holds 2 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2000-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuyuki Nakazawa. Retrieved from https://idiyas.com/inventor/nobuyuki-nakazawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.7

ph-index = 1

Forward Citations = 19(Granted Patents)


Location History:

  • Kawasaki, JP (2000)
  • Kanagawa, JP (2022)

Company Filing History:


Years Active: 2000-2022

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2 patents (USPTO):Explore Patents

Title: Nobuyuki Nakazawa: Innovator in Measurement Technology

Introduction

Nobuyuki Nakazawa is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of measurement technology, holding 2 patents that showcase his innovative spirit and technical expertise.

Latest Patents

One of his latest inventions is the Measurement X-ray CT apparatus. This apparatus calibrates the geometrical positional relationship between the focus of an X-ray source, an X-ray detector, and the rotation center of a rotating table in advance. It obtains projection images by irradiating the object to be measured with X-rays, performing a CT scan, and generating a three-dimensional image through CT reconstruction of the projection images. The apparatus includes a reference frame made of a material that is less susceptible to environmental changes, along with sensors that obtain calibration values during the CT scan. These calibration values are crucial for the CT reconstruction process.

Another notable invention is the Non-contact surface roughness measuring device. This device is designed to avoid damage caused by collision with a workpiece while ensuring that a non-contact surface roughness probe is set at an appropriate position relative to the measurement surface. It features a non-contact surface roughness probe and a touch-signal probe attached to the tip of an arm of a coordinate measuring machine. The touch-signal probe detects contact, allowing the non-contact surface roughness probe to be positioned optimally relative to the workpiece.

Career Highlights

Nobuyuki Nakazawa is associated with Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has allowed him to develop innovative solutions that enhance measurement accuracy and efficiency.

Collaborations

He has collaborated with notable coworkers such as Sadayuki Matsumiya and Masanori Arai, contributing to advancements in measurement technology through teamwork and shared expertise.

Conclusion

Nobuyuki Nakazawa's contributions to measurement technology through his patents reflect his dedication to innovation and precision. His work continues to influence the field, making significant strides in the development of advanced measurement devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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