Nobuyuki Ikeo

Title: Nobuyuki Ikeo: Innovator in Charged Particle Beam Technology

Introduction

Nobuyuki Ikeo is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of charged particle beam technology. With a focus on image acquisition methods, his work has advanced the capabilities of imaging systems.

Latest Patents

Nobuyuki Ikeo holds 1 patent for a "Charged particle beam device and image acquisition method." This innovative device acquires images by scanning a specimen with a probe formed from a charged particle beam. It detects signals emitted from the specimen, enhancing the accuracy and quality of imaging. The device includes an optical system that forms the probe, a control unit for correction processing and image acquisition, and an image processing unit that generates images based on multiple frame images. The control unit corrects the shifting of the irradiation position of the probe, ensuring precise imaging.

Career Highlights

Nobuyuki Ikeo has made significant strides in his career, particularly through his work at Jeol Ltd. His expertise in charged particle beam technology has positioned him as a key figure in the development of advanced imaging systems. His contributions have not only improved the functionality of imaging devices but have also paved the way for future innovations in the field.

Collaborations

Nobuyuki Ikeo has collaborated with Kenichi Tsutsumi, working together to enhance the capabilities of charged particle beam devices. Their partnership has led to advancements in imaging technology, showcasing the importance of teamwork in innovation.

Conclusion

Nobuyuki Ikeo's work in charged particle beam technology exemplifies the impact of innovation in imaging systems. His patent and career achievements highlight his role as a leading inventor in this specialized field.