This inventor holds 24 USPTO granted patents, primarily in Optical Imaging Systems. Top assignees: Minolta Camera Kabushiki Kaisha, Minolta Company, Ltd., Minolta Camera Co., Ltd.. Active years: 1986-2001.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuo Kanai. Retrieved from https://idiyas.com/inventor/nobuo-kanai
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
Average Co-Inventor Count = 2.2
ph-index = 8
Forward Citations = 269(Granted Patents)
Location History:
- Yawata, JP (1986)
- Osaka, JP (1989 - 1993)
- Azuchi, JP (1993)
- Toyohashi, JP (1993 - 2001)
Company Filing History:
13 out of 2,979 Minolta Camera Kabushiki Kaisha
10 out of 2,816 
Minolta Company, Ltd.
1 out of 76 Minolta Camera Co., Ltd.
Years Active: 1986-2001
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Areas of Expertise:
Image Forming Apparatus
Laser Beam Scanning
Optical Scanning System
Anamorphic Illumination
Digital Imaging
Optical Device
Overhead Projector
Reading Apparatus
Illumination Device
Scanning Optical System
Composite Apparatus
Slit Exposure
24 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuo Kanai. Retrieved from https://idiyas.com/inventor/nobuo-kanai
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]