The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2000
Filed:
Nov. 04, 1996
Kenji Takeshita, Aichi-ken, JP;
Nobuo Kanai, Toyohashi, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
In a scanning optical system in which image-surface curvature in the traverse direction is corrected properly without degrading imaging performance in the scanning direction and in which the transverse magnification is approximately uniform irrespective of the deflection angle, the influence of form errors in the imaging lens upon the image is substantially suppressed so as not to degrade the quality of the image. The scanning optical system is provided with a aspherical lens having a refractive power only in the traverse direction and having a TSL shape whose curvature radius increases as the distance in the scanning direction from the center of the lens (the position in which the curvature radius in the traverse direction is smallest) increases. The aspherical lens is disposed in such a way that the line of symmetry that passes through its center is parallel to and at a distance from the optical axis of a first lens unit on the upstream side of a scanning path in the scanning direction. The traverse magnification of the scanning optical system is set at a value in a predetermined range.