Nobuo Fujinaga

Title: Nobuo Fujinaga: Innovator in Charged Particle Beam Technology

Introduction

Nobuo Fujinaga is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology. With a total of 2 patents, his work focuses on enhancing the precision and efficiency of charged particle beam apparatuses.

Latest Patents

Fujinaga's latest patents include a groundbreaking charged particle beam apparatus. The objective of this invention is to provide a system that can quickly identify correction conditions for new aberrations that arise during beam adjustments. The apparatus is designed to include an objective lens that focuses a beam emitted from a charged particle source to irradiate a specimen. Additionally, it features a visual field movement deflector that adjusts the arrival position of the beam concerning the specimen. An aberration correction unit is also integrated into the system, which is strategically placed between the visual field movement deflector and the charged particle source. This unit is crucial for suppressing changes in the beam's arrival position under varying irradiation conditions.

Career Highlights

Fujinaga is associated with Hitachi High-Technologies Corporation, where he continues to innovate in his field. His work has been instrumental in advancing the capabilities of charged particle beam technology, making significant impacts in various applications.

Collaborations

Throughout his career, Fujinaga has collaborated with notable colleagues, including Yuta Kawamoto and Akira Ikegami. These partnerships have fostered a collaborative environment that enhances innovation and development in their projects.

Conclusion

Nobuo Fujinaga's contributions to charged particle beam technology exemplify his dedication to innovation. His patents reflect a commitment to improving the precision and functionality of scientific instruments. His work continues to influence the field and inspire future advancements.