Yokohama, Japan

Nobukatsu Machii

This inventor holds 4 USPTO granted patents and 3 published patent applications and 2 EPO patents. Top assignee: Nikon Corporation. Active years: 2020-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobukatsu Machii. Retrieved from https://idiyas.com/inventor/nobukatsu-machii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2020-2021

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4 patents (USPTO):Explore Patents

Title: Nobukatsu Machii: Innovator in Measurement Processing Technology

Introduction

Nobukatsu Machii is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of measurement processing technology, particularly in the context of x-ray inspection apparatuses. With a total of 4 patents to his name, Machii continues to push the boundaries of innovation in his field.

Latest Patents

Machii's latest patents include a measurement processing device, measurement processing method, measurement processing program, and a method for manufacturing structure. The measurement processing device is designed for an x-ray inspection apparatus that detects x-rays passing through a specimen. It features a detection unit that sequentially inspects multiple specimens based on acquired transmission images. The device includes a setting unit that defines the region to be inspected, a determination unit that assesses the non-defectiveness of that region using the transmission image, a correction unit that adjusts the inspected region based on the determination results, and a display control unit that presents the corrected region.

Career Highlights

Nobukatsu Machii is currently employed at Nikon Corporation, a leading company in imaging and optical products. His work at Nikon has allowed him to develop innovative solutions that enhance the efficiency and accuracy of x-ray inspections.

Collaborations

Machii has collaborated with notable colleagues such as Fuminori Hayano and Akitoshi Kawai. Their combined expertise has contributed to the advancement of measurement processing technologies.

Conclusion

Nobukatsu Machii is a key figure in the realm of measurement processing technology, with a focus on x-ray inspection systems. His innovative patents and collaborations reflect his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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