Nobuhiko Kurata

Title: Nobuhiko Kurata: Innovator in Semiconductor Technology

Introduction

Nobuhiko Kurata is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the design of integrated circuit devices. His innovative approach has led to the development of a unique patent that enhances the functionality and reliability of semiconductor devices.

Latest Patents

Kurata holds a patent for a semiconductor integrated circuit device that comprises different level interconnection layers connected by conductor layers, including a conductor layer for redundancy. This invention features a third interconnection layer positioned near a first interconnection layer and a second interconnection layer located above the first. The first and second interconnection layers are interconnected by a regular via plug and a redundancy via plug. The redundancy via plug is strategically placed beside the regular via plug and between it and the third interconnection layer. Additionally, an extended portion of the second interconnection layer extends toward the third interconnection layer, with dimensions smaller than the minimum prescribed in the interconnection line design rule.

Career Highlights

Nobuhiko Kurata is associated with Kabushiki Kaisha Toshiba, a leading company in the technology sector. His work at Toshiba has allowed him to explore and implement innovative solutions in semiconductor design. His contributions have been instrumental in advancing the capabilities of integrated circuits.

Collaborations

Kurata has collaborated with notable colleagues, including Kouichirou Inoue and Shinji Fujii. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Nobuhiko Kurata's work in semiconductor technology exemplifies the spirit of innovation. His patent reflects a deep understanding of integrated circuit design and a commitment to enhancing device reliability. His contributions continue to influence the field and inspire future advancements in technology.