Nitesh Mishra

Title: Nitesh Mishra: Innovator in Integrated Circuit Testing

Introduction

Nitesh Mishra is a prominent inventor based in Kanpur, India. He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work focuses on enhancing the efficiency and reliability of memory testing systems.

Latest Patents

One of Nitesh's latest patents is titled "System and method for parallel memory test." This invention involves a device that includes a controller connected to memory components through a forward data path, along with a signature register linked via a backward data path. The controller sends memory address signals and a clock signal to the memory components, enabling them to read stored values. The backward data path receives memory signals from the components, which are then combined into a single signal. The signature register calculates a test signature based on this combined signal and compares it to an expected signature.

Another notable patent is "High speed integrated circuit testing." This integrated circuit features a clocked circuit that operates in response to a clock, a clock providing circuit that can clock the circuit at a selectable frequency, and a test circuit connected to both the clock providing circuit and the clocked circuit. Additionally, it includes a pad designed to receive an external signal, allowing the selectable frequency to be adjusted based on that signal.

Career Highlights

Nitesh Mishra is currently employed at Texas Instruments Corporation, where he continues to innovate in the field of integrated circuits. His work has been instrumental in advancing testing methodologies that improve the performance and reliability of electronic devices.

Collaborations

Nitesh collaborates with talented individuals such as Nikita Naresh and Devraj Matharampallil Rajagopal, contributing to a dynamic and innovative work environment.

Conclusion

Nitesh Mishra's contributions to integrated circuit testing through his patents demonstrate his commitment to innovation and excellence in technology. His work not only enhances the efficiency of memory testing but also sets a standard for future advancements in the field.