The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Nov. 30, 2023
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Nitesh Mishra, Chakeri, IN;
Hrithik Sahni, New Delhi, IN;
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56004 (2013.01); G11C 29/56016 (2013.01); G11C 2029/5602 (2013.01);
Abstract
Systems and methods may perform sequential automatic test pattern generation (ATPG) on parallel memory units. A first array of logic gates may output enable signals to cause multiple memory units to be enabled in parallel. Test pattern generation and test control logic may perform forward path testing, backward path testing, and any other appropriate testing on the enabled memory units. The systems and methods may then move on to another group of memory units, which are enabled in parallel and tested in parallel.