Nim Cho Lam

Title: The Innovations of Nim Cho Lam

Introduction

Nim Cho Lam is an accomplished inventor based in Saratoga, CA (US). He has made significant contributions to the field of semiconductor technology, particularly in the design and fabrication of probe card assemblies. His innovative work has led to the development of a patent that enhances the efficiency and effectiveness of electrical connections in integrated circuits.

Latest Patents

Nim Cho Lam holds a patent for "Structures and processes for fabrication of probe card assemblies with multi-layer interconnect." This patent focuses on a layout of a semiconductor wafer that comprises a plurality of integrated circuits at pre-defined locations. Each integrated circuit features a set of electrical connection pads. The invention establishes a probe chip contactor with a unit standard cell on the probe side, corresponding to each arranged integrated circuit. The design is stepped and repeated to create a wafer scale standard cell layout. The opposite contact side of the probe chip contactor connects to a central structure, such as a Z-block or PC board, which typically includes a fixed array of vias with predetermined X, Y, and Z locations. The routing of the contact side is preferably automated, allowing for efficient electrical connections between the substrate and the Z-block.

Career Highlights

Nim Cho Lam is currently employed at Advantest (Singapore) Pte Ltd, where he continues to innovate in the semiconductor industry. His expertise in probe card technology has positioned him as a key player in advancing the capabilities of integrated circuit testing.

Collaborations

Throughout his career, Nim has collaborated with notable colleagues, including Fu Chiung Chong and William R Bottoms. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Nim Cho Lam's contributions to semiconductor technology through his patent and work at Advantest (Singapore) Pte Ltd highlight his role as a significant inventor in the field. His innovative designs and collaborative efforts continue to shape the future of integrated circuit testing.