This inventor holds 1 USPTO granted patent. Top assignee: Infosys Limited. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Nihar Sharma: Innovator in Test Input Data Generation
Introduction
Nihar Sharma is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of software testing through his innovative patent. His work focuses on generating negative test input data, which is crucial for ensuring the robustness of software applications.
Latest Patents
Nihar Sharma holds a patent titled "Methods for generating a negative test input data and devices thereof." This invention provides a method and system for generating negative test input data. The process involves extracting a set of attributes and attribute properties from a requirement specification. A constraint representation syntax is framed from these attributes, leading to the modeling of a structured diagram. From this diagram, a set of use cases and path predicates are constructed. The invention determines one or more attribute classes based on attribute constraints and dependencies. Finally, negative test input data is generated using a genetic algorithm from these attribute classes. Nihar Sharma has 1 patent to his name.
Career Highlights
Nihar Sharma is currently employed at Infosys Limited, a leading multinational corporation in the field of information technology. His role involves leveraging his expertise in software testing and innovation to enhance the quality of software products. His contributions have been instrumental in advancing testing methodologies within the organization.
Collaborations
Nihar has collaborated with several talented individuals in his field, including Anjaneyulu Pasala and Saurav Singh. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Nihar Sharma's work in generating negative test input data represents a significant advancement in software testing methodologies. His innovative approach not only enhances the quality of software applications but also showcases the importance of creativity in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
