The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Dec. 04, 2014
Applicant:

Infosys Limited, Bangalore, IN;

Inventors:

Anjaneyulu Pasala, Bangalore, IN;

Nihar Sharma, Bangalore, IN;

Saurav Singh, New Delhi, IN;

Assignee:

Infosys Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01);
Abstract

The present invention provides a method and system for generating negative test input data. A set of attributes and a set of attribute properties can be extracted from a requirement specification. A constraint representation syntax can be framed from the extracted set of attribute properties. A structured diagram is modeled from the framed constraint representation syntax and a set of use cases, a set of path predicates can be constructed from the structured diagram. One or more attribute classes can be determined from the set of path predicates based on an attribute constraint and an attribute dependency. The negative test input data shall be generated from the one or more attribute classes using genetic algorithm.


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