Company Filing History:
Years Active: 2008
Title: Innovations by Nicolas Laurent in Photoluminescence Technology
Introduction
Nicolas Laurent is an accomplished inventor based in Corenc, France. He has made significant contributions to the field of photoluminescence, particularly in the non-contact measurement of contaminants and defects in materials. His innovative approach has the potential to enhance the quality control processes in various industries.
Latest Patents
Nicolas Laurent holds a patent for a method titled "Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece." This method utilizes photoluminescence to identify defects in a sub-surface region of a sample. The process involves performing a first probe of the sample to produce a first data set indicating defects primarily in the surface layer. A second probe generates a second data set that indicates defects in both the surface layer and sub-surface region. By subtracting the first data set from the second, a third data set is created, highlighting defects located mainly in the sub-surface region. The method may also include normalization of the first data set relative to the second before subtraction, and it employs lasers of different wavelengths for the probing.
Career Highlights
Nicolas Laurent is currently associated with Nanometrics Inc., where he continues to develop and refine his innovative techniques. His work has positioned him as a key figure in advancing photoluminescence applications in material science.
Collaborations
Nicolas has collaborated with notable colleagues, including Andrzej Buczkowski and Steven G. Hummel. Their combined expertise has contributed to the successful development of advanced measurement techniques.
Conclusion
Nicolas Laurent's contributions to photoluminescence technology exemplify the impact of innovative thinking in material science. His patented methods not only enhance defect detection but also pave the way for improved quality control in various applications.