Beek, Netherlands

Nico Karssemeijer

This inventor holds 10 USPTO granted patents and 2 EPO patents. Top assignees: R2 Technology, Inc., Hologic, Inc., Altera Corporation. Active years: 2000-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nico Karssemeijer. Retrieved from https://idiyas.com/inventor/nico-karssemeijer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 80.0


Average Co-Inventor Count = 2.1

ph-index = 6

Forward Citations = 241(Granted Patents)


Location History:

  • Ubbergen, NL (2015 - 2018)
  • Beek, NL (2000 - 2019)

Company Filing History:


Years Active: 2000-2019

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10 patents (USPTO):Explore Patents

Title: Inventor Nico Karssemeijer

Introduction: Nico Karssemeijer is a pioneering inventor based in Beek, Netherlands, known for her groundbreaking contributions to the field of medical imaging and computer-aided diagnosis.

Latest Patents: Nico Karssemeijer holds several patents related to innovative algorithms and technologies in the area of breast cancer detection and diagnosis, revolutionizing the way medical professionals approach this critical aspect of healthcare.

Career Highlights: With a distinguished career spanning over two decades, Nico Karssemeijer has been at the forefront of developing cutting-edge solutions that have significantly improved the accuracy and efficiency of breast cancer screening programs worldwide.

Collaborations: Throughout her career, Nico Karssemeijer has collaborated with leading medical institutions, research centers, and technology companies to further advance the field of medical imaging and diagnostic tools, solidifying her reputation as a visionary inventor in the healthcare industry.

Conclusion: Nico Karssemeijer's relentless dedication to innovation and her commitment to improving healthcare outcomes through technology have established her as a prominent figure in the realm of medical imaging and computer-aided diagnosis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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