The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2001

Filed:

Aug. 27, 1998
Applicant:
Inventors:

Jimmy R. Roehrig, Palo Alto, CA (US);

Takeshi Doi, Palo Alto, CA (US);

Nico Karssemeijer, Beek, NL;

Guido M. Te Brake, Utrecht, NL;

Assignee:

R2 Technology, Inc., Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A method and system for detecting suspicious portions of digital mammograms by using independently calculated mass and spiculation information is disclosed. The method is for use in a computer aided diagnosis system that is designed to bring suspicious or possibly cancerous lesions in fibrous breast tissue to the attention of a radiologist or other medical professional. In a preferred embodiment, spiculation information and mass information are independently calculated, with the computed spiculation information not being dependent on results of the mass information computation, thus leading to greater reliability. Systems according to a preferred embodiment also compute spiculation information either prior to, or concurrently with, the computation of mass information, thus allowing increased overall system speed.


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