Royal Oak, MI, United States of America

Nicholas S Ellis

This inventor holds 1 USPTO granted patent. Top assignee: Gm Global Technolgoy Operations, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nicholas S Ellis. Retrieved from https://idiyas.com/inventor/nicholas-s-ellis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nicholas S. Ellis and Conveyor Rail Inspection Innovation.

Introduction

Nicholas S. Ellis is an inventor associated with Royal Oak, Michigan, and Gm Global Technology Operations, Inc. His patent describes a method for inspecting conveyor rails and identifying potential faults through three-dimensional surface analysis.

Latest Patents

Ellis is credited with 1 patent, titled “Conveyor Health Inspection Method.” The method illuminates a conveyor rail with a line of light directed obliquely at its surface, then moves the light along the rail while sensing the reflected light. The resulting measurements are used to create a three-dimensional topography of the surface. Thresholds help identify features of interest, whose physical characteristics are analyzed to detect rail faults and map their locations.

Career Highlights

Ellis’s disclosed invention applies optical sensing and three-dimensional mapping to conveyor maintenance. By identifying and locating potential rail faults, the method offers a structured approach to inspecting conveyor surfaces.

Collaborations

Ellis is associated with Gm Global Technology Operations, Inc. His listed coworkers include Dennis J. Carroll and Charles A. Wiley.

Conclusion

Nicholas S. Ellis’s patent presents a light-based inspection method that creates a three-dimensional view of conveyor rails to help identify and locate potential faults.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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