The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Jan. 24, 2025
GM Global Technology Operations Llc, Detroit, MI (US);
Dennis J. Carroll, Leander, TX (US);
Charles A. Wiley, Austin, TX (US);
David R. Kracko, Dewitt, MI (US);
Nicholas S. Ellis, Royal Oak, MI (US);
Philip L. Griggs, Troy, MO (US);
Eric R. Newcomb, Midlothian, TX (US);
Robert Hardin, Cedar Park, TX (US);
Joshua Huang, Round Rock, TX (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
A method for inspecting a rail of a conveyor system includes illuminating the rail with a light beam in the form of a line of light directed obliquely to a surface of the rail. The method further includes translating the light beam along the rail in a direction of translation, the direction of translation generally perpendicular to the line of light and sensing reflection of the light beam from the surface as the light beam is translated. The method additionally includes using the reflection to create a three-dimensional topography of the surface, applying thresholds to the three-dimensional topography to detect features of potential interest in the topography, and determining physical characteristics of the features of potential interest. In addition, the method includes using the physical characteristics to identify faults in the rail associated with the features of potential interest and mapping locations of the faults.