Eliav, Israel

Netanel Refaelovich

This inventor holds 1 USPTO granted patent. Top assignee: Inziv Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Netanel Refaelovich. Retrieved from https://idiyas.com/inventor/netanel-refaelovich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Netanel Refaelovich and Automated Probe Card Replacement

Introduction

Netanel Refaelovich is an inventor based in Eliav, Israel, and works at Inziv Ltd. His patent work addresses automation in semiconductor testing, where probe cards are used to test and inspect semiconductor devices.

Latest Patents

Refaelovich is associated with 1 patent: “System and Method for Automatic Probe Card Replacement.” The invention describes a test system that automatically exchanges a used probe card for a new one. A probe card manipulator moves the used card from the measurement position to a replacement position, and a probe card exchanger transfers it to a cassette. The system then selects a new card, moves it from the cassette to the replacement position, and uses the manipulator to place it in the measurement position. The new probe card includes an array of flexible probes.

Career Highlights

Refaelovich’s disclosed invention focuses on automating probe card changes within semiconductor test systems. By coordinating a manipulator, an exchanger, and a cassette, the system is designed to carry out the replacement sequence without relying on manual card handling.

Collaborations

Refaelovich’s listed coworkers include Ori Dadoosh and Yuri Levinzon. He works at Inziv Ltd., where his patent-related work concerns semiconductor testing technology.

Conclusion

Netanel Refaelovich’s patent describes an automated approach to replacing probe cards, connecting his work at Inziv Ltd. with the practical needs of semiconductor testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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