The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Nov. 14, 2025
Inziv Ltd., Jerusalem, IL;
Ori Dadoosh, Raanana, IL;
Yuri Levinzon, Tel Aviv, IL;
Doobie Abraham, Haifa, IL;
Yuval Yohai, Rehovot, IL;
Netanel Refaelovich, Eliav, IL;
Matan Saydoff, Reut, IL;
Yaakov Davidi, Nof Aylon, IL;
Baoting Huang, Tel Aviv, IL;
Andrey Ignatov, Jerusalem, IL;
David Colin Chase, Jerusalem, IL;
InZiv Ltd., Jerusalem, IL;
Abstract
A system and a method of automatically replacing a probe card used to test and inspect semiconductor devices are disclosed. The method for replacing a probe card in a test system includes using a probe card manipulator to move a used probe card from a measurement position to a replacement position, using a probe card exchanger to move the used probe card from the replacement position to a cassette, choosing a new probe card to replace the used probe card, using the probe card exchanger to move the new probe card from the cassette to the replacement position, using the probe card manipulator to engage the new probe card, and using the probe card manipulator to move the new probe card to the measurement position. The new probe card includes an array of flexible probes.