David Colin Chase

Title: David Colin Chase and Semiconductor Test Automation.

Introduction

David Colin Chase is an inventor associated with Jerusalem, Israel, and Inziv Ltd. His patent work addresses automation in semiconductor testing, particularly the replacement of probe cards used to inspect semiconductor devices.

Latest Patents

Chase is associated with 1 patent: “System and Method for Automatic Probe Card Replacement.” The invention describes a system and method for replacing a probe card in a test system. A probe card manipulator moves the used card from the measurement position to a replacement position, while a probe card exchanger transfers it to a cassette. The exchanger then brings a selected new card from the cassette to the replacement position, where the manipulator engages it and moves it into the measurement position. The new probe card includes an array of flexible probes.

Career Highlights

Chase’s patent reflects work on automating a practical step in semiconductor-device testing. By coordinating a manipulator, an exchanger, and a cassette, the system is designed to replace probe cards without relying on the described sequence being performed entirely by hand.

Collaborations

Chase is associated with Inziv Ltd. His listed coworkers include Ori Dadoosh and Yuri Levinzon.

Conclusion

David Colin Chase’s patent focuses on automated probe-card replacement, a process intended to support semiconductor testing and inspection through coordinated equipment handling.