Neil H Judell

Title: An Overview of Inventor Neil H. Judell

Introduction

Neil H. Judell, located in Andover, MA, is a notable inventor recognized for his contributions to advanced imaging and measurement systems. With a total of three patents to his name, Judell has demonstrated significant innovation in the fields of computed tomography and wafer thickness measurement, among other technological advancements.

Latest Patents

Judell's most recent patents include:

1. **Enhanced Resolution Imaging and Measurement Systems**: This invention involves a computed axial tomography (CAT) system featuring a ring assembly that encompasses the object being examined. Components of this patent include an X-ray source, an array of X-ray sensors, a drive motor for rotation, and sophisticated measurement control circuitry. The system is designed to generate a high-resolution estimate of measurement data using a reconstruction tensor derived from cross-covariance and auto-covariance tensors.

2. **Enhanced Resolution Wafer Thickness Measurement System**: This patent describes a method and apparatus for measuring the thickness of wafers over a two-dimensional area. It employs a thickness measurement probe and involves generating a detailed image represented by a two-dimensional array of thickness measurements. This patent also utilizes a reconstruction tensor to enhance measurement accuracy and resolution.

Career Highlights

Neil H. Judell has made significant contributions to his field, particularly during his tenure at organizations like Technology Development Group, Inc. and Hampshire Instruments, Inc. His work in these companies exemplifies his commitment to advancing technologies that enhance measurement precision and imaging capabilities.

Collaborations

Throughout his career, Judell has collaborated with various stakeholders within the technology sector, contributing to the development of innovative solutions in imaging and measurement. His partnerships have likely facilitated the advancement of methodologies that apply advanced mathematical techniques to practical technological applications.

Conclusion

Neil H. Judell is a prominent figure in the realm of technological innovation. His patents reflect a deep understanding of imaging and measurement systems, showcasing his ability to combine theoretical knowledge with practical applications. As advancements in these fields continue, Judell's contributions are likely to influence future developments significantly.