The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1996

Filed:

Nov. 18, 1993
Applicant:
Inventor:

Neil H Judell, Andover, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364563 ; 36441313 ; 36441314 ; 36441325 ; 12866001 ; 1286531 ;
Abstract

A computed axial tomography (CAT) system including a ring assembly surrounding a location at which the object is placed; an X-ray source mounted on the ring assembly; an array of X-ray sensors arranged on the periphery of the ring assembly for measuring X-ray intensity from the object; a drive motor for rotating the ring assembly about the object; measurement control circuitry controlling the drive motor, receiving data from the array of X-ray sensors and generating a plurality of vectors of X-ray data therefrom, said plurality of vectors being represented by a measured column tensor; a memory for storing the measured column tensor; and a computer programmed to left multiply the measured column tensor stored in said memory by a reconstruction tensor T to obtain an estimate of a desired measurement column tensor, wherein said reconstruction tensor T is equal to R.sub.dm R.sub.mm.sup.-1, R.sub.dm being a cross-covariance tensor computed for d, a desired measurement column tensor, and m, the measured column tensor, and R.sub.mm being an auto-covariance tensor computed for m, the measured column tensor, and wherein the estimate of a desired measurement column tensor represents an estimate of measurements that would be obtained from an hypothetical array of X-ray sensors having a higher resolution than said first mentioned array of X-ray sensors.


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