Neil Graf

Title: Neil Graf: Innovator in Electronic Component Testing

Introduction

Neil Graf is a notable inventor based in Saint Paul, MN (US). He has made significant contributions to the field of electronic component testing, particularly through his innovative designs and methods. With a total of 2 patents to his name, Graf continues to push the boundaries of technology in his area of expertise.

Latest Patents

One of Neil Graf's latest patents is the "Selectively geometric shaped contact pin for electronic component testing and method of fabrication." This invention relates to a method of fabricating contact pins used in testing circuit components, typically integrated circuits. The design allows for the selective radius of certain portions of each pin to achieve desired performance. The process involves cutting the desired shape from a blank material, treating the cut portion to round all exposed edges, and then cutting out the remaining portion from the larger blank area, leaving non-radiused edges.

Career Highlights

Neil Graf is currently employed at Johnstech International Corporation, where he applies his expertise in electronic component testing. His work has been instrumental in developing advanced testing solutions that enhance the performance and reliability of electronic devices.

Collaborations

Throughout his career, Neil has collaborated with talented individuals such as David A Johnson and Michael W Andres. These collaborations have contributed to the innovative environment at Johnstech International Corporation and have led to the development of cutting-edge technologies.

Conclusion

Neil Graf's contributions to the field of electronic component testing exemplify his dedication to innovation and excellence. His patents and collaborative efforts continue to influence the industry positively.