The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Apr. 25, 2016
Applicant:

Johnstech International Corporation, Minneapolis, MN (US);

Inventors:

David Johnson, Wayzata, MN (US);

Michael Andres, Inver Grove Heights, MN (US);

Neil Graf, St. Paul, MN (US);

Kenna Pretts, Coon Rapids, MN (US);

Assignee:

Johnstech International Corporation, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 43/16 (2006.01); G01R 1/067 (2006.01); H01R 4/58 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); H01R 4/58 (2013.01); H01R 43/16 (2013.01);
Abstract

This disclosure relates to a method of fabrication contact pinsused in testing circuit components, typically integrated circuits and the contact pins themselves. It is desirable to selectively radius certain portions of each pin to achieve desired performance of the entire pin. The portion to be radiused is cut to the desire shaped from a blank material. The portion which is not to be radiused is not cut to its final shape from the blank but to a larger shape which includes the material for the final shape. The entire cut portion is then treated to shape or round all exposed edges. Then the remaining portion of the pin is cut out from the larger blank area which was previously retained, leaving those portions with non-radiused edged.


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