Cherry Hill, NJ, United States of America

Naum Gudin

This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignees: Intest IP Corporation, Intest Corporation. Active years: 2005-2008.


% Patents Active = 100.0


Average Co-Inventor Count = 2.1

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2005-2008

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3 patents (USPTO):Explore Patents

Title: Naum Gudin: Innovator in Electronic Test Head Docking Systems

Introduction

Naum Gudin is a notable inventor based in Cherry Hill, NJ (US), recognized for his contributions to the field of electronic testing. With a total of three patents to his name, Gudin has made significant advancements in the technology surrounding electronic test heads.

Latest Patents

One of Gudin's latest patents is the "Test Head Docking System and Method." This innovative system is designed for docking an electronic test head with a handling apparatus. It includes an assembly that facilitates the partial alignment and subsequent connection of the electronic test head and the handling apparatus. Additionally, the system features a power-driven actuator that provides only partially powered assistance in the docking process.

Career Highlights

Throughout his career, Naum Gudin has worked with reputable companies such as Intest IP Corporation and Intest Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the development of advanced electronic testing technologies.

Collaborations

Some of Gudin's notable coworkers include Christopher L. West and I. Marvin Weilerstein. Their collaboration has likely contributed to the innovative projects and patents that Gudin has developed over the years.

Conclusion

Naum Gudin's work in the field of electronic test head docking systems showcases his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving electronic testing processes, making him a significant figure in his field.

Profile summary based on public USPTO records.
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