Intest IP Corporation

Intest Corporation

Naum Gudin

Christopher L West

Alyn R Holt

I Marvin Weilerstein

Nils O Ny

A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.

Test head docking system and method

An apparatus is used for coupling a test head to a mounting unit such as a cradle in which the test head pivots. A base is attachable to a test head. An extension member extends away from the test head. A slider slides away from and towards a center of gravity of the test head. The slider is attachable to the mounting unit. An adjustment member extends from the extension member for fixing the position of the slider relative to the base.

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Cherry Hill, NJ, United States of America

Naum Gudin