Naresh Chandra Srinivas Koppineedi

Title: Naresh Chandra Srinivas Koppineedi: Innovator in Integrated Circuit Testing

Introduction

Naresh Chandra Srinivas Koppineedi is a prominent inventor based in Bengaluru, India. He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through innovative patents. His work is particularly focused on enhancing the efficiency and effectiveness of scan testing methodologies.

Latest Patents

Koppineedi holds a patent for a "System and apparatus for scanning integrated circuits with numerically controlled delay lines." This invention presents a system and method for scan testing a Numerically Controlled Delay Line (NCDL) and latches controlled by the NCDL. The NCDL is managed by control logic, while a switch controls the latches using a clock signal that is independent of the control logic. Additionally, a controllability circuit provides test vectors to the NCDL and manages its operations. The outputs from the NCDL are monitored by an observability circuit that captures these outputs, ensuring accurate testing and validation.

Career Highlights

Koppineedi is currently employed at Broadcom Corporation, a leading technology company known for its innovative solutions in semiconductors and telecommunications. His role at Broadcom allows him to apply his expertise in integrated circuits and contribute to the development of cutting-edge technologies.

Collaborations

Throughout his career, Koppineedi has collaborated with talented professionals, including Anand Pande and Syed Mohammed Ali. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Naresh Chandra Srinivas Koppineedi is a notable inventor whose work in integrated circuit testing has made a significant impact in the field. His patent reflects his commitment to advancing technology and improving testing methodologies.