The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2006

Filed:

Apr. 22, 2003
Applicants:

Anand Pande, Bangalore, IN;

Syed Mohammed Ali, Bangalore, IN;

Naresh Chandra Srinivas Koppineedi, Bangalore, IN;

Ravindra Bindus, Bangalore, IN;

Ramanujan K. Valmiki, Bangalore, IN;

Inventors:

Anand Pande, Bangalore, IN;

Syed Mohammed Ali, Bangalore, IN;

Naresh Chandra Srinivas Koppineedi, Bangalore, IN;

Ravindra Bindus, Bangalore, IN;

Ramanujan K. Valmiki, Bangalore, IN;

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for scan testing an NCDL and latches controlled by the NCDL is presented. The NCDL is controlled by control logic, a switch is used to control the latches by a clock signal that is not controlled by the control logic. A controllability circuit provides test vectors to, and controls, the NCDL. The outputs of the NCDL are observed by an observability circuit that captures the outputs of the NCDL.


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