This inventor holds 1 USPTO granted patent. Top assignee: Raytex Corporation. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Naoyuki Nohara: Innovator in Edge Flaw Detection Technology
Introduction
Naoyuki Nohara is a prominent inventor based in Tokyo, Japan. He is known for his innovative contributions to the field of edge flaw detection technology. His work has significantly advanced the methods used to identify flaws in various materials, enhancing quality control processes in manufacturing.
Latest Patents
Nohara holds a patent for an edge flaw detection device. This device features an elliptical mirror with a mirror surface on the inside and a cutout at the apex, allowing an object to be inserted. It includes a light-emitting unit that radiates coherent light toward the edge of the object, positioned near the first focal point of the elliptical mirror. A photo detector is located at the second focal position, while a light-shielding member protects against low-order diffracted light that is regularly reflected. The light-emitting unit can be adjusted in the thickness direction of the object, enabling it to radiate coherent light across different ranges at the object's edge.
Career Highlights
Nohara is currently employed at Raytex Corporation, where he continues to develop and refine his innovative technologies. His work at Raytex has positioned him as a key player in the field of optical detection systems.
Collaborations
Nohara collaborates with Hideo Sakai, a fellow innovator, to further enhance the capabilities of their technologies. Their partnership has led to significant advancements in edge flaw detection methods.
Conclusion
Naoyuki Nohara's contributions to edge flaw detection technology exemplify his commitment to innovation and quality in manufacturing processes. His patent and ongoing work at Raytex Corporation highlight his role as a leading inventor in this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile