Kyoto, Japan

Naoya Furuhashi

This inventor holds 1 USPTO granted patent. Top assignee: Shimadzu Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoya Furuhashi. Retrieved from https://idiyas.com/inventor/naoya-furuhashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Naoya Furuhashi: X-Ray Imaging Innovation

Introduction

Naoya Furuhashi is an inventor associated with Kyoto, Japan, and Shimadzu Corporation. His patent work focuses on improving the interpretation and display of three-dimensional models generated from X-ray images.

Latest Patents

Furuhashi is named on 1 patent: “X-ray Imaging System and Device Display Method.” The invention generates a three-dimensional model of a device using first and second X-ray images. It identifies potentially inaccurate portions of the model by detecting a parallel portion of a linear-structured device that extends in a direction parallel to the epipolar line. The system then displays the model alongside information based on the identified inaccuracies, helping users assess the model’s shape.

Career Highlights

Furuhashi’s listed patent reflects work in X-ray imaging, three-dimensional modeling, and visual presentation of potential shape inaccuracies. He is associated with Shimadzu Corporation, a company whose work includes scientific and medical technologies.

Collaborations

Shota Oshikawa is identified as Furuhashi’s coworker. Their shared professional association is connected with Shimadzu Corporation.

Conclusion

Naoya Furuhashi’s patent describes a method for identifying and presenting potentially inaccurate features in three-dimensional models created from X-ray images, contributing to clearer device imaging and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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