The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jan. 16, 2023
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Shota Oshikawa, Kyoto, JP;
Naoya Furuhashi, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); A61B 6/12 (2006.01); A61B 6/46 (2024.01); G06T 7/00 (2017.01); G06T 17/00 (2006.01); A61M 25/01 (2006.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); A61B 6/12 (2013.01); A61B 6/466 (2013.01); G06T 7/0012 (2013.01); G06T 17/00 (2013.01); A61B 2034/2065 (2016.02); A61M 2025/0166 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30168 (2013.01); G06T 2210/41 (2013.01);
Abstract
The X-ray imaging system generates a three-dimensional model of a device based on a first X-ray image and a second X-ray image. The X-ray imaging system determines an inaccurate portion of the shape in the three-dimensional model () by identifying a parallel portion extending along a direction parallel to the epipolar line, from the device having a linear structure. The X-ray imaging system displays the three-dimensional model and a display based on the determination result of the inaccurate portion of the shape in the three-dimensional model.