Naomi Kotwal

Title: Naomi Kotwal - Innovator in X-ray Imaging Technology

Introduction

Naomi Kotwal is a prominent inventor based in Fremont, CA, known for her contributions to the field of x-ray imaging technology. With a focus on enhancing imaging systems, she has developed innovative solutions that optimize image parameters for better analysis and interpretation.

Latest Patents

Naomi holds a patent for a "Multi energy X-ray microscope data acquisition and image reconstruction system and method." This invention discloses an x-ray imaging system that enables the optimization of image parameters based on multiple tomographic volumes captured using an x-ray microscopy system. The system allows operators to control image contrast for selected slices and applies this information to all slices in two or more tomographic volume data sets. This results in a combined volume with optimized image contrast throughout. Additionally, the system facilitates navigation within the volumes through functional annotation, improvements in volume registration, and noise suppression.

Career Highlights

Naomi is currently employed at Carl Zeiss X-ray Microscopy, Inc., where she continues to advance her research and development in x-ray imaging technologies. Her work has significantly impacted the field, providing tools that enhance the capabilities of x-ray microscopy.

Collaborations

Naomi collaborates with notable colleagues, including Thomas Anthony Case and Susan Candell, contributing to a dynamic team focused on innovation in imaging technology.

Conclusion

Naomi Kotwal's work in x-ray imaging technology exemplifies the spirit of innovation and dedication to advancing scientific understanding through improved imaging systems. Her contributions are paving the way for future developments in the field.