Tokyo, Japan

Naoki Shindou

This inventor holds 7 USPTO granted patents and 20 published patent applications. Top assignees: Nec Corporation, Nec C Orporation. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Shindou. Retrieved from https://idiyas.com/inventor/naoki-shindou-mwtipe3h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 

% Patents Active = 28.6

Average Co-Inventor Count = 8.2

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2024-2026

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7 patents (USPTO):Explore Patents

Title: Naoki Shindou: Innovator in Display Technology

Introduction

Naoki Shindou is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of display technology, holding a total of 7 patents. His work focuses on enhancing user interfaces and improving the overall experience of display screens.

Latest Patents

One of Naoki Shindou's latest patents is a display screen with a graphical user interface. This innovation aims to provide users with a more intuitive and engaging interaction with their devices. The advancements in his patents reflect his commitment to pushing the boundaries of technology.

Career Highlights

Naoki Shindou is currently employed at NEC Corporation, a leading company in the technology sector. His role at NEC allows him to collaborate with other talented professionals and contribute to groundbreaking projects in display technology.

Collaborations

Some of his notable coworkers include Hiroaki Takeuchi and Ryo Kawai. Their collaboration fosters a creative environment that encourages innovation and the development of new ideas.

Conclusion

Naoki Shindou's contributions to display technology through his patents and work at NEC Corporation highlight his role as a key innovator in the field. His dedication to improving user interfaces continues to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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