The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Jun. 29, 2023
Nec Corporation, Tokyo, JP;
Jianquan Liu, Tokyo, JP;
Noboru Yoshida, Tokyo, JP;
Tingting Dong, Tokyo, JP;
Ryo Kawai, Tokyo, JP;
Satoshi Yamazaki, Tokyo, JP;
Karen Stephen, Tokyo, JP;
Yuta Namiki, Tokyo, JP;
Naoki Shindou, Tokyo, JP;
Youhei Sasaki, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
To utilize a result of image analysis, an image analysis apparatusincludes an analysis result acquisition unitand a counting unit. The analysis result acquisition unitacquires analysis information being information acquired by analyzing a still image and including an appearance attribute to which a person included in the still image belongs. The counting unitcounts, for each appearance attribute, the number of persons belonging to the appearance attribute in the still image by using the analysis information, and generates counting information indicating a result of the counting in units of still images.