Musashino, Japan

Naoki Miyazaki

This inventor holds 1 USPTO granted patent. Top assignee: Yokogawa Electric Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Miyazaki. Retrieved from https://idiyas.com/inventor/naoki-miyazaki-0rh45eo1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Naoki Miyazaki: Innovator in Semiconductor Testing

Introduction

Naoki Miyazaki is a prominent inventor based in Musashino, Japan. He has made significant contributions to the field of semiconductor testing, showcasing his expertise through innovative patents. His work is instrumental in advancing technology and improving testing systems.

Latest Patents

Miyazaki holds a patent for a semiconductor test system. This system includes pin electronics (PE) cards that are capable of applying a test pattern to devices under test (DUTs) connected to the PE cards. The system captures output patterns from the DUTs in response to the test pattern and compares these patterns with an expected value pattern. It determines whether the patterns correspond with the expected values. Additionally, a fail control card aggregates fail information about the DUTs and transfers this information to the PE cards.

Career Highlights

Naoki Miyazaki is associated with Yokogawa Electric Corporation, where he continues to innovate and develop advanced testing solutions. His work has been pivotal in enhancing the efficiency and accuracy of semiconductor testing processes.

Collaborations

Miyazaki collaborates with Fumihiro Saito, a fellow innovator in the field. Their partnership contributes to the development of cutting-edge technologies in semiconductor testing.

Conclusion

Naoki Miyazaki's contributions to semiconductor testing through his innovative patent and collaboration with industry professionals highlight his role as a key figure in technological advancements. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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