The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7849375 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 07, 2010

Filed:

May. 28, 2008
Applicants:

Fumihiro Saito, Musashino, JP;

Naoki Miyazaki, Musashino, JP;

Inventors:

Fumihiro Saito, Musashino, JP;

Naoki Miyazaki, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor test system includes: pin electronics ('PE') cards each being operable to: a) apply a test pattern to device under tests ('DUTs') each connected to the PE cards; b) capture patterns outputted in response to the test pattern from the DUTs; c) compare the patterns with an expected value pattern; and d) determine whether or not the patterns correspond with the expected value pattern, and a fail control card being operable to: e) aggregate fail information about the DUTs inputted through the PE cards every the DUTs; and f) transfer the fail information to the PE cards.


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Saito, Fumihiro. (2010). Semiconductor test system (U.S. Patent No. 7849375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7849375

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