Kanagawa, Japan

Naoki Mitsutani

This inventor holds 2 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Mitsutani. Retrieved from https://idiyas.com/inventor/naoki-mitsutani-2h5ivnbj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.8

ph-index = 1


Company Filing History:


Years Active: 2024

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2 patents (USPTO):Explore Patents

Title: Naoki Mitsutani: Innovator in Measurement Technology

Introduction

Naoki Mitsutani is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of measurement technology, holding two patents that showcase his innovative approach to solving complex measurement challenges.

Latest Patents

Mitsutani's latest patents include a "Measurement System, Measurement Method and Non-Transitory Storage Medium." This invention features a multi-axis robot equipped with a measurement unit that includes imaging devices. The system is designed to capture images at multiple positions, allowing for precise measurement of distances between feature points on a workpiece. His second patent, "Measurement Apparatus, Control Apparatus, and Control Method," involves a sensor that measures a workpiece while being moved by a multi-axis robot. This apparatus determines measurement positions and controls the sensor's movement to ensure accurate data collection.

Career Highlights

Mitsutani has built a successful career at Mitutoyo Corporation, a leading company in precision measurement instruments. His work has significantly advanced the capabilities of measurement systems, making them more efficient and accurate.

Collaborations

Some of his notable coworkers include Kazuhiko Hidaka and Tomohiro Kiire, who have collaborated with him on various projects within the company.

Conclusion

Naoki Mitsutani's contributions to measurement technology through his innovative patents and work at Mitutoyo Corporation highlight his role as a key figure in the field. His inventions continue to influence the way measurements are conducted in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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