Naohiro Ikeda

Title: Naohiro Ikeda: Innovator in Testing Technology

Introduction

Naohiro Ikeda is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of testing technology, holding a total of 2 patents. His work focuses on developing advanced test apparatuses and control systems that enhance the efficiency and reliability of testing devices.

Latest Patents

Ikeda's latest patents include a "Test apparatus and program therefor" and a "Fail-safe controller." The test apparatus features multiple test modules that supply test patterns to devices under test, synchronized with a reference clock. This innovative design ensures that the timing of the test patterns is equalized, improving the accuracy of the testing process. The fail-safe controller is designed to monitor the status of an apparatus, performing arithmetic and logical operations to output control signals. It incorporates multiple processors and data storage elements to ensure reliable operation and comparison of results.

Career Highlights

Throughout his career, Naohiro Ikeda has worked with notable companies such as Hitachi, Ltd. and Advantest Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the development of cutting-edge technologies in the testing industry.

Collaborations

Ikeda has collaborated with talented individuals in his field, including Kotaro Shimamura and Takeshi Takehara. These partnerships have fostered innovation and have been instrumental in the success of his projects.

Conclusion

Naohiro Ikeda's contributions to testing technology through his patents and career achievements highlight his role as an influential inventor. His work continues to impact the industry positively, paving the way for future advancements in testing methodologies.