The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Apr. 27, 2005
Naohiro Ikeda, Tokyo, JP;
Naohiro Ikeda, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a test apparatus having a plurality of test modules for supplying test patterns used in testing devices under test to the devices corresponding to a given timing signal, a reference clock generating section for generating a reference clock, a plurality of timing supply sections, provided corresponding to the plurality of test modules, for generating the timing signal corresponding to the reference clock and supplying the timing signal to the corresponding test module, respectively, and a control section for controlling timing for outputting the timing signal output by the timing supply section so that timing of the respective test patterns output by the plurality of test modules is practically equalized based on a test module delay of each test module until when it outputs the test pattern after receiving the timing signal.