Yamanashi, Japan

Nanako Shinoda

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Tokyo Electron Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nanako Shinoda. Retrieved from https://idiyas.com/inventor/nanako-shinoda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nanako Shinoda: Inventor in Substrate Transfer Technology.

Introduction

Nanako Shinoda is an inventor associated with Yamanashi, Japan, and Tokyo Electron Limited. Her patent work addresses substrate handling and transfer processes used in manufacturing equipment.

Latest Patents

Shinoda is associated with 1 patent, titled “Substrate Transfer Method.” The invention describes a process for transferring two substrates between transfer devices and mounting sections. It detects the substrates’ positional shifts, calculates a correction to the first device’s delivery position, and uses that correction together with the second substrate’s shift amount to determine the receiving position for the second device’s pick. These adjustments are intended to support accurate substrate placement and transfer.

Career Highlights

Shinoda’s listed patent reflects work on precision transfer methods relevant to semiconductor manufacturing equipment. She is associated with Tokyo Electron Limited, a company that develops equipment and technologies for semiconductor production.

Collaborations

Shinoda is listed alongside fellow inventor Shinya Okano in connection with the substrate transfer method.

Conclusion

Nanako Shinoda’s patent focuses on correcting substrate positions during multi-step transfers, contributing to more precise handling in manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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