Seoul, South Korea

Nam Yoon Kim

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Iucf-Hyu (Industry-University Cooperation, Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nam Yoon Kim. Retrieved from https://idiyas.com/inventor/nam-yoon-kim-befljx40

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Nam Yoon Kim: Semiconductor Device Fabrication and Imaging

Introduction

Nam Yoon Kim is an inventor associated with Seoul, South Korea. His patent work concerns semiconductor device fabrication and the use of high-resolution imaging to detect semiconductor patterns.

Latest Patents

Kim is associated with 1 patent: “Method for Fabricating a Semiconductor Device.” The method describes forming a semiconductor pattern with first and second layers on a substrate, then applying a coating layer to the first layer. A dyeing substance, made by combining an antibody or protein with a fluorophore, is attached to the coating to create a dyeing layer. An ultra-high-resolution microscope photographs the fluorophore to detect the semiconductor pattern.

Career Highlights

Kim’s listed company affiliations include Samsung Electronics and Iucf-Hyu (Industry-University Cooperation). His patent reflects work at the intersection of semiconductor processing and microscopy-based detection.

Collaborations

His listed coworkers include Doory Kim and Jae Hwang Jung.

Conclusion

Nam Yoon Kim’s patent describes a technique that combines semiconductor fabrication, fluorescent labeling, and ultra-high-resolution microscopy to detect semiconductor patterns.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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