Wakayama, Japan

Nakaie Toshiyuki

This inventor holds 2 USPTO granted patents. Top assignee: Hanwa Electronic Co., Ltd.. Active years: 1989-1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nakaie Toshiyuki. Retrieved from https://idiyas.com/inventor/nakaie-toshiyuki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1989-1990

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2 patents (USPTO):Explore Patents

Title: Nakaie Toshiyuki: Innovator in Electronic Measurement Technologies

Introduction

Nakaie Toshiyuki is a prominent inventor based in Wakayama, Japan. He has made significant contributions to the field of electronic measurement technologies, holding a total of 2 patents. His work focuses on enhancing the accuracy and efficiency of resistance measurements and integrated circuit testing.

Latest Patents

Nakaie Toshiyuki's latest patents include an "Apparatus for detecting noise in the measurement of very small resistance" and a "Base board for testing integrated circuits." The first patent describes a sophisticated system involving a pair of R-C integrating circuits that utilize switches to manage voltage inputs for precise resistance measurements. The second patent outlines a plug board designed for testing integrated circuits, featuring multiple sockets and a drive system for rotation, which enhances the testing process.

Career Highlights

Nakaie Toshiyuki is currently employed at Hanwa Electronic Co., Ltd., where he continues to innovate and develop new technologies. His expertise in electronic measurement has positioned him as a valuable asset in the industry.

Collaborations

Nakaie has collaborated with Oonishi Tethuo, contributing to advancements in their respective fields. Their partnership has fostered innovation and improved methodologies in electronic testing.

Conclusion

Nakaie Toshiyuki's contributions to electronic measurement technologies reflect his dedication to innovation and excellence. His patents demonstrate a commitment to improving the accuracy of resistance measurements and integrated circuit testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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