The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 1990

Filed:

Jul. 26, 1989
Applicant:
Inventor:

Nakaie Toshiyuki, Wakayama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324691 ; 324133 ; 340661 ;
Abstract

A pair of a first and a second R-C integrating circuits connected in series. A first switch S.sub.1 supplies a first combined voltage E.sub.1 +E.sub.3 of a first positive threshold voltage E.sub.1 and a positive initial set up voltage E.sub.3 to a first capacitor in the first R-C circuit, and a second switch S.sub.2 supplies a second capacitor with a second combined voltage of a second positive threshold voltage E.sub.2 with a negative initial set up voltage -E.sub.4. The switches S.sub.1 and S.sub.2 are closed before the input of the signal to be measured. The switches are opened after the input of the signal. A first comparator compares a first discharged voltage output from the first capacitor and the first threshold voltage E.sub.1, and a second comparator compares a second discharged voltage output from the second capacitor and the second threshold voltage E.sub.2. A logic circuit is connected to the output terminals of the first and second comparators, respectively, and determine in conjunction with a timing circuit whether the first and second discharged voltages are within a range between the first threshold voltage E.sub.1 and second threshold voltage E.sub.2 within a predetermined time period of the input of the signal to be measured, so as to provide an indication to judge the right time for resistance measurements.


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Toshiyuki, Nakaie. (1990). Apparatus for detecting noise in the measurement of very small resistance (U.S. Patent No. 4929886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4929886

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